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Add a system-wide BIT_N macro, implemented via an LUT on SH, and use it in the TAGCACHE_IS_* macros in place of per-set LUTs, removing duplication of data between those LUTs and the mask values used on other targets.

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git-svn-id: svn://svn.rockbox.org/rockbox/trunk@21195 a1c6a512-1295-4272-9138-f99709370657
This commit is contained in:
Andrew Mahone 2009-06-06 00:00:58 +00:00
parent fe72c890a7
commit de7c5711c5
5 changed files with 29 additions and 31 deletions
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4
firmware/export/system.h
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@ -266,6 +266,10 @@ static inline uint32_t swap_odd_even32(uint32_t value)
#endif /* !SIMULATOR */
#ifndef TEST_BIT_N
#define TEST_BIT_N(n, mask) ((1UL << (n)) & (mask))
#endif
/* Declare this as HIGHEST_IRQ_LEVEL if they don't differ */
#ifndef DISABLE_INTERRUPTS
#define DISABLE_INTERRUPTS HIGHEST_IRQ_LEVEL